---
title: "ITC (A): papers and universities"
description: "ITC (IEEE International Test Conference) is rated A by the CORE Conference Rankings (ICORE2026); OpenAlex lists 167 of its papers from 2024–2026 (69 in 2024, 98 in 2025; 2026 not in OpenAlex yet). By the countries of the authors' institutions, the most papers come from the United States (80), Germany (26) and Taiwan (19)."
url: https://scholar4ai.com/proceedings/itc
markdown_url: https://scholar4ai.com/proceedings/itc.md
license: CC BY-NC 4.0 (https://creativecommons.org/licenses/by-nc/4.0/)
share_text: "ITC (IEEE International Test Conference) is rated A by the CORE Conference Rankings (ICORE2026); OpenAlex lists 167 of its papers from 2024–2026 (69 in 2024, 98 in 2025; 2026 not in OpenAlex yet). (as of 2026-11-02)"
data_url: https://scholar4ai.com/data/rankings.json
updated: 2026-11-02T12:20:52+09:00
window: 2026-10-04 to 2026-11-02
source: OpenAlex (CC0)
---

# ITC: IEEE International Test Conference — papers and institutions, 2024–2026

Papers of ITC, IEEE International Test Conference (CORE rank A; field: Computer science (general)), 2024–2026: per year, the institutions, countries and topics, and the most-cited papers. Ranks are those of the CORE Conference Rankings, edition ICORE2026 (portal.core.edu.au), applied to every year shown. Papers are the works OpenAlex lists for the conference's proceedings, or for the issues of a conference-linked journal that publishes its papers (such as PACMPL, PVLDB or ACM TOG), by publication year; workshops, companion volumes, posters and Findings are left out. A paper counts once for each institution and country among its authors' affiliations as OpenAlex assigns them; papers without affiliations in OpenAlex count for none. For conferences published in book series that OpenAlex files as one source (LNCS, LIPIcs, SIAM and IOS Press proceedings), the papers are found by DOI: those of the volumes with the conference's title in Crossref, or LIPIcs DOIs, which name the conference. Conferences without DOIs (PMLR, USENIX, OpenReview) are listed without counts. A dash (–) for a year means OpenAlex has no papers of the conference for it yet: the proceedings are not published or indexed yet, or the conference did not meet that year (some meet every other year). 2026 counts what OpenAlex had indexed by 2026-11-02.

All conferences: https://scholar4ai.com/proceedings.md

## Key findings

- ITC (IEEE International Test Conference) is rated A by the CORE Conference Rankings (ICORE2026); OpenAlex lists 167 of its papers from 2024–2026 (69 in 2024, 98 in 2025; 2026 not in OpenAlex yet).
- By the countries of the authors' institutions, the most papers come from the United States (80), Germany (26) and Taiwan (19).
- The institutions with the most papers are Siemens (Germany) (13), Arizona State University (13) and Intel (United States) (12).
- Its most-cited paper of these years is “FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks” (2024), with 12 citations.
- OpenAlex has affiliations for only 89% of its papers, so the institution and country counts are incomplete.

## Papers per year

*ITC papers per publication year in OpenAlex (–: not in OpenAlex yet)*

| Year | Papers | With affiliations |
|---|---:|---:|
| 2024 | 69 | 58 |
| 2025 | 98 | 90 |
| 2026 | – | – |

## Sources

*Where OpenAlex lists the papers*

| OpenAlex source | Which papers |
|---|---|
| [S4210209697](https://openalex.org/S4210209697) | The conference's proceedings |

## Who publishes there

*Institutions with the most ITC papers, 2024–2026*

| # | Institution | Papers |
|---:|---|---:|
| 1 | Siemens (Germany) | 13 |
| 2 | Arizona State University | 13 |
| 3 | Intel (United States) | 12 |
| 4 | Politecnico di Torino | 11 |
| 5 | [Delft University of Technology](https://scholar4ai.com/institutions/delft-university-of-technology.md) | 8 |
| 6 | Taiwan Semiconductor Manufacturing Company (Taiwan) | 7 |
| 7 | NXP (United States) | 7 |
| 8 | Taiwan Semiconductor Manufacturing Company (United States) | 6 |
| 9 | Synopsys (United States) | 6 |
| 10 | Karlsruhe Institute of Technology | 5 |

*Countries with the most ITC papers, 2024–2026*

| # | Country | Papers |
|---:|---|---:|
| 1 | United States | 80 |
| 2 | Germany | 26 |
| 3 | Taiwan | 19 |
| 4 | Italy | 11 |
| 5 | China | 9 |
| 6 | Netherlands | 9 |
| 7 | South Korea | 5 |
| 8 | France | 4 |
| 9 | Japan | 4 |
| 10 | Belgium | 3 |

*Keywords with the most ITC papers, 2024–2026*

| # | Keyword | Papers |
|---:|---|---:|
| 1 | process variation | 17 |
| 2 | design for testability | 15 |
| 3 | automatic test pattern generation | 9 |
| 4 | chiplets | 8 |
| 5 | non-volatile memory | 8 |
| 6 | test time reduction | 8 |
| 7 | built-in self-test | 7 |
| 8 | hardware security | 7 |
| 9 | resistive random access memory | 7 |
| 10 | scan-based testing | 7 |

## Most-cited papers

*Most-cited ITC papers of 2024–2026 (citations counted by OpenAlex)*

| # | Citations | Title | Published | Authors |
|---:|---:|---|---|---|
| 1 | 12 | [FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks](https://doi.org/10.1109/itc51657.2024.00029) | 2024-11-03 | Hossein Pourmehrani, Javad Bahrami, Parsa Nooralinejad et al. |
| 2 | 12 | [Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification](https://doi.org/10.1109/itc51657.2024.00011) | 2024-11-03 | Abhishek Kumar Mishra, Suman Kumar, Anush Lingamoorthy et al. |
| 3 | 9 | [Digital Scan and ATPG for Analog Circuits](https://doi.org/10.1109/itc51657.2024.00055) | 2024-11-03 | Stephen Sunter, Krzysztof Jurga |
| 4 | 8 | [SEC-CiM: Selective Error Compensation for ReRAM-based Compute-in-Memory*](https://doi.org/10.1109/itc51657.2024.00037) | 2024-11-03 | Ashish Reddy Bommana, Farshad Firouzi, Chukwufumnanya Ogbogu et al. |
| 5 | 7 | [Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing](https://doi.org/10.1109/itc51657.2024.00013) | 2024-11-03 | Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer et al. |
| 6 | 7 | [Defects, Fault Modeling, and Test Development Framework for FeFETs](https://doi.org/10.1109/itc51657.2024.00026) | 2024-11-03 | Changhao Wang, Sicong Yuan, Hanzhi Xun et al. |
| 7 | 7 | [High-Bandwidth IJTAG over SSN](https://doi.org/10.1109/itc51657.2024.00036) | 2024-11-03 | Jonathan Gaudet, Jan Burchard, Matthias Kampmann et al. |
| 8 | 7 | [WM-Graph: Graph-Based Approach for Wafermap Analytics](https://doi.org/10.1109/itc51657.2024.00030) | 2024-11-03 | Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 9 | 6 | [E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry](https://doi.org/10.1109/itc51657.2024.00044) | 2024-11-03 | Eduardo Ortega, Jonti Talukdar, Woohyun Paik et al. |
| 10 | 6 | [Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs](https://doi.org/10.1109/itc51657.2024.00059) | 2024-11-03 | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard et al. |

## Cite this page

Scholar4AI. (2026). ITC: IEEE International Test Conference — papers and institutions, 2024–2026. Journal and Conference Research Rankings. Retrieved November 2, 2026, from https://scholar4ai.com/proceedings/itc

```bibtex
@misc{scholar4ai-proceedings-itc,
  author = {{Scholar4AI}},
  title = {ITC: IEEE International Test Conference — papers and institutions, 2024–2026},
  year = {2026},
  howpublished = {\url{https://scholar4ai.com/proceedings/itc}},
  urldate = {2026-11-02},
  note = {Journal and Conference Research Rankings; data from OpenAlex (CC0); licensed CC BY-NC 4.0}
}
```

License: CC BY-NC 4.0 (https://creativecommons.org/licenses/by-nc/4.0/).