Scholar4AI Updated 2026-11-02 12:20 UTC+09:00

ITC: IEEE International Test Conference — papers and institutions, 2024–2026

Papers of ITC, IEEE International Test Conference (CORE rank A; field: Computer science (general)), 2024–2026: per year, the institutions, countries and topics, and the most-cited papers. Ranks are those of the CORE Conference Rankings, edition ICORE2026 (portal.core.edu.au), applied to every year shown. Papers are the works OpenAlex lists for the conference's proceedings, or for the issues of a conference-linked journal that publishes its papers (such as PACMPL, PVLDB or ACM TOG), by publication year; workshops, companion volumes, posters and Findings are left out. A paper counts once for each institution and country among its authors' affiliations as OpenAlex assigns them; papers without affiliations in OpenAlex count for none. For conferences published in book series that OpenAlex files as one source (LNCS, LIPIcs, SIAM and IOS Press proceedings), the papers are found by DOI: those of the volumes with the conference's title in Crossref, or LIPIcs DOIs, which name the conference. Conferences without DOIs (PMLR, USENIX, OpenReview) are listed without counts. A dash (–) for a year means OpenAlex has no papers of the conference for it yet: the proceedings are not published or indexed yet, or the conference did not meet that year (some meet every other year). 2026 counts what OpenAlex had indexed by 2026-11-02. Also as Markdown.

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Key findings#

  • ITC (IEEE International Test Conference) is rated A by the CORE Conference Rankings (ICORE2026); OpenAlex lists 167 of its papers from 2024–2026 (69 in 2024, 98 in 2025; 2026 not in OpenAlex yet).
  • By the countries of the authors' institutions, the most papers come from the United States (80), Germany (26) and Taiwan (19).
  • The institutions with the most papers are Siemens (Germany) (13), Arizona State University (13) and Intel (United States) (12).
  • Its most-cited paper of these years is “FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks” (2024), with 12 citations.
  • OpenAlex has affiliations for only 89% of its papers, so the institution and country counts are incomplete.

Papers per year#

ITC papers per publication year in OpenAlex (–: not in OpenAlex yet)
YearPapersWith affiliations
20246958
20259890
2026––

Sources#

Where OpenAlex lists the papers
OpenAlex sourceWhich papers
S4210209697The conference's proceedings

Who publishes there#

Institutions with the most ITC papers, 2024–2026
#InstitutionPapers
1Siemens (Germany)13
2Arizona State University13
3Intel (United States)12
4Politecnico di Torino11
5Delft University of Technology8
6Taiwan Semiconductor Manufacturing Company (Taiwan)7
7NXP (United States)7
8Taiwan Semiconductor Manufacturing Company (United States)6
9Synopsys (United States)6
10Karlsruhe Institute of Technology5
Countries with the most ITC papers, 2024–2026
#CountryPapers
1United States80
2Germany26
3Taiwan19
4Italy11
5China9
6Netherlands9
7South Korea5
8France4
9Japan4
10Belgium3
Keywords with the most ITC papers, 2024–2026
#KeywordPapers
1process variation17
2design for testability15
3automatic test pattern generation9
4chiplets8
5non-volatile memory8
6test time reduction8
7built-in self-test7
8hardware security7
9resistive random access memory7
10scan-based testing7

Most-cited papers#

Most-cited ITC papers of 2024–2026 (citations counted by OpenAlex)
#CitationsTitlePublishedAuthors
112FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks2024-11-03Hossein Pourmehrani, Javad Bahrami, Parsa Nooralinejad et al.
212Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification2024-11-03Abhishek Kumar Mishra, Suman Kumar, Anush Lingamoorthy et al.
39Digital Scan and ATPG for Analog Circuits2024-11-03Stephen Sunter, Krzysztof Jurga
48SEC-CiM: Selective Error Compensation for ReRAM-based Compute-in-Memory*2024-11-03Ashish Reddy Bommana, Farshad Firouzi, Chukwufumnanya Ogbogu et al.
57Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing2024-11-03Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer et al.
67Defects, Fault Modeling, and Test Development Framework for FeFETs2024-11-03Changhao Wang, Sicong Yuan, Hanzhi Xun et al.
77High-Bandwidth IJTAG over SSN2024-11-03Jonathan Gaudet, Jan Burchard, Matthias Kampmann et al.
87WM-Graph: Graph-Based Approach for Wafermap Analytics2024-11-03Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
96E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry2024-11-03Eduardo Ortega, Jonti Talukdar, Woohyun Paik et al.
106Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs2024-11-03Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard et al.

Conferences in the same field#

ICRA · DAC · ISCA · HPCA · MICRO · IROS · DATE · SC · IPDPS · ICS · ICCAD · DSN · ISLPED · HPDC · FPGA

Cite this page

Scholar4AI. (2026). ITC: IEEE International Test Conference — papers and institutions, 2024–2026. Journal and Conference Research Rankings. Retrieved November 2, 2026, from https://scholar4ai.com/proceedings/itc

@misc{scholar4ai-proceedings-itc,
  author = {{Scholar4AI}},
  title = {ITC: IEEE International Test Conference — papers and institutions, 2024–2026},
  year = {2026},
  howpublished = {\url{https://scholar4ai.com/proceedings/itc}},
  urldate = {2026-11-02},
  note = {Journal and Conference Research Rankings; data from OpenAlex (CC0); licensed CC BY-NC 4.0}
}

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